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ACCURACY OF MEASUREMENT IN NANOMETROLOGY
JAN SRAMEK, ROBERT JANKOVYCH
REMOVING ADDITIVE NOISE IN MEASUREMENTS OF LOW SOUND PRESSURE LEVELS
Martin Nevrela, Michal Weisz, Jan Szweda, Martin Vasina
DYNAMIC POSITION MEASUREMENT OF THE CNC MACHINE USING LASER INTERFEROMETRY
KRISTINA VIROSTKOVA, MICHAL HOLUB, TOMAS MAREK, JIRI KROUPA, JIRI MAREK
HIGH-RESOLUTION GEOMETRY MEASUREMENT WITH A COLLABORATIVE ROBOT
M. Riedl, R. Danzl, M. Felberbauer, T. Lankmair
A FLEXIBLE AND ROBUST 3D COORDINATE MEASUREMENT SYSTEM BASED ON WHITE LIGHT INTERFEROMETRY FOR DEVIATION MEASUREMENTS ON SWISS-TYPE TURNING MACHINES
H.-W. Lahmann, S. Schmalzried, G. Ketterer, D. Weber, F. Welzel, D. Jeyara

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